Michigan based k-Space Associates, a world-wide supplier of advanced instrumentation and software for the surface science and thin-film technology industries, has received a Phase II Small Business Innovation Research (SBIR) award from the Department of Energy (DOE) to develop an “Advanced, High-Sensitivity, Multi-Species, In Situ Film Growth Monitor Utilizing Atomic Absorption Spectroscopy”.
Phase I of the project, the development of a prototype Atomic Absorption Spectroscopy (AAS) instrument, had been completed in 2015. This instrument was developed and tested on a sputter deposition system at Argonne National Laboratory. The instrument provides real-time atomic flux measurements to enable high-accuracy film growth control during the deposition of a broad variety of thin-film materials.
k-Space has a long history of bringing new products to market that not only address the need of one application, but lend themselves to broader applicability. k-Space’s development of a state-of-the-art Atomic Absorption Spectroscopy instrument is in high demand for thin-film growth monitoring in the laser, photovoltaic, OLED and LED industries.