Sunday, November 30, 2014
New Reflection High-Energy Electron Diffraction Tool
Michigan based k-Space Associates, a leader in thin-film analysis applications for more than 20 years, now offers the kSA 400 Lite, a system that measures real-time growth rate in thin-film production. It has the same hardware as the kSA 400, the industry’s most powerful analytical Reflection High-Energy Electron Diffraction (RHEED) system. The kSA 400 Lite software can be upgraded to the the full kSA 400 at any time. You can see k-Space at the following upcoming tradeshows: 2014 MRS Fall Meeting & Exhibit, Nov. 30 – Dec. 5, 2014 in Boston, and The Exposition for Semiconductor Manufacturing, December 3-5, 2014 in Tokyo, Japan.
Posted by KB at 7:15 AM